Our Quality Approach
- Pre- approve bill of materials (BOM)
- Ensure product quality actually meets industry standards
- Go beyond basic industry standards to fill in the gaps
- Complete access to all parts of production and transport stations in factory
- Red-flag approach to signal & deal with systematic risk
- Ability to reject product in Asia and in UK/Europe
In-line Production Inspection
In-line inspection covers:
- Review of IQC versus standard, customer specifications
- Implementation IPQC, OQC and SOP’s e.g.
- lamination/ curing conditions &time
- internal transportation etc.. - Workers skills and attitude
- Observing failure rates at key workstations
- Rejection of substandard product & rework loop
- 100% traceability through MES
- STC power measurement, plus tolerance
- Calibration of test devices & equipment maintenance
- Continuous improvement cycle
- Cells soldering strength measurement
- EL image enlarged checking
- EVA Peel strength & cross- linkage rate test
- Wet leakage current test
- In-line product & defect tracking
Final Product Inspection
- Random sampling of final product -out of the box-
- Assuring products meet specs:
-materials, certification, plus tolerance,
-safety, traceability, customer specs.
tested according to relevant standards; - Alerting Buyer to product deviations and dealing with quality issues:
-replacing sub-standard product prior to shipment
-preventing bad or wrong shipments - Document check, loading inspection
- Verify compliance of Bill of Material (BOM) with IEC certification
- Inspection & Testing to verify industry standards are met
- Red-flag approach to signal systematic issues
- Escalation of sampling to confirm & deal with quality issues.
- Batch acceptance or rejection based on:
- agreed quality criteria
- agreed accept/ reject criterion ( AQL rate, inspection level ) - Measuring product quality for sampled modules by:
- confirming customer requirements;
- visual inspection, aspect measurement;
- safety & electrical performance;
- power measurement by re- flashing at STC;
- re-do Electroluminescence imaging; comparison with original factory EL images;
- factory flash-test data review;